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DETERMINATION OF ALUMINUM, SILICON, ION, URANIUM, AND THORIUM IN BERYLLIUM BY X-RAY FLUORESCENCE
Author(s) -
G.E. Walden,
A. D. Condrey
Publication year - 1966
Language(s) - English
Resource type - Reports
DOI - 10.2172/4521563
Subject(s) - thorium , uranium , beryllium , detection limit , radiochemistry , analytical chemistry (journal) , chemistry , x ray , x ray fluorescence , relative standard deviation , aluminium , ion , silicon , nuclear chemistry , materials science , physics , fluorescence , nuclear physics , organic chemistry , chromatography , quantum mechanics

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