Open AccessTime-resolved voltage breakdown in various insulators due to 2-MeV electronics
Author(s) -
L.M. Erickson,
Douglas C. Oakley
Publication year - 1973
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/4471273
Subject(s) - dielectric strength , materials science , breakdown voltage , high voltage , electrode , surface roughness , surface finish , dielectric , fabrication , analytical chemistry (journal) , voltage , atomic physics , electrical engineering , forensic engineering , composite material , chemistry , physics , optoelectronics , engineering , alternative medicine , pathology , chromatography , medicine
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