Open AccessX-ray fluorescence technique for measuring coating thickness
Author(s) -
J.E. Coulter
Publication year - 1974
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/4352274
Subject(s) - coating , x ray fluorescence , materials science , uranium , fluorescence , substrate (aquarium) , zinc , nickel , x ray , analytical chemistry (journal) , metallurgy , optics , composite material , chemistry , chromatography , physics , oceanography , geology
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