
Causes of the yield-point phenomenon in commercial beryllium products
Author(s) -
D. R. Floyd
Publication year - 1974
Language(s) - English
Resource type - Reports
DOI - 10.2172/4309095
Subject(s) - materials science , grain size , yield (engineering) , metallurgy , grain boundary , hardening (computing) , substructure , microstructure , texture (cosmology) , composite material , artificial intelligence , computer science , engineering , image (mathematics) , structural engineering , layer (electronics)