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Atom probe field ion microscope
Author(s) -
Kaj Stolt
Publication year - 1971
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/4101184
Subject(s) - field ion microscope , tungsten , materials science , nitrogen , nickel , ion implantation , transmission electron microscopy , helium , microstructure , field electron emission , evaporation , ion , electron microscope , analytical chemistry (journal) , electron , atomic physics , nanotechnology , chemistry , metallurgy , optics , physics , nuclear physics , organic chemistry , chromatography , thermodynamics

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