SNAP-2 RELIABILITY PROGRAM | Zendy

D.S. Burgess | Zendy

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SNAP-2 RELIABILITY PROGRAM

Author(s) -

D.S. Burgess

Publication year - 1963

Language(s) - English

Resource type - Reports

DOI - 10.2172/4048742

Subject(s) - reliability (semiconductor) , reliability engineering , component (thermodynamics) , selection (genetic algorithm) , computer science , engineering , power (physics) , physics , quantum mechanics , artificial intelligence , thermodynamics

The basic concept of the SNAP 2 reliability program is discussed. The basis for the reliability requirements for SNAP 2 is presented, and the fundamental methods by which these requirements can be accomplished are described. The reliability objectives for the system, a description of basic failure characteristics, and design considerations for reliability margins and component selection are presented, together with test plans for establishing reliability margins and for demonstrating system reliability. (auth

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