Open AccessSNAP-2 RELIABILITY PROGRAM
Author(s) -
David Burgess
Publication year - 1963
Language(s) - English
Resource type - Reports
DOI - 10.2172/4048742
Subject(s) - reliability (semiconductor) , reliability engineering , component (thermodynamics) , selection (genetic algorithm) , computer science , engineering , power (physics) , physics , quantum mechanics , artificial intelligence , thermodynamics
The basic concept of the SNAP 2 reliability program is discussed. The basis for the reliability requirements for SNAP 2 is presented, and the fundamental methods by which these requirements can be accomplished are described. The reliability objectives for the system, a description of basic failure characteristics, and design considerations for reliability margins and component selection are presented, together with test plans for establishing reliability margins and for demonstrating system reliability. (auth