Study of nickel-tungsten alloy (Ni<sub>4</sub>) with field ion field emission microscopy
Author(s) -
Joaquı́n Lira-Olivares
Publication year - 1970
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/4021566
Subject(s) - field ion microscope , tungsten , brightness , nickel , alloy , ion , field electron emission , materials science , field (mathematics) , dark field microscopy , micrograph , microscopy , analytical chemistry (journal) , chemistry , metallurgy , physics , optics , scanning electron microscope , composite material , electron , nuclear physics , mathematics , organic chemistry , chromatography , pure mathematics
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