X-ray and {Gamma}-ray spectroscopy of solids under pressure. Technical progress report, November 1996--December 1998

This report describes the recent synchrotron x-ray absorption fine structure (XAFS) measurements on a number of systems that undergo pressure induced changes in local structure at high pressure. The reader should also refer to the accompanying renewal proposal for a more in-depth discussion of the general scope of this program, and its relevance to condensed matter science. The author merely states that the methods here are aimed at using XAFS to probe the various phenomena that are caused by high pressure, especially including various structural, and/or electronic, changes or transitions. The general technique is based upon a pressure cell which utilizes sintered boron carbide anvils, since diamond anvils generally produce Bragg glitches which spoil the high quality XAFS necessary for precision structural measurements. Sample pressure is determined at the beam-line by measuring and analyzing, via XAFS, the compression of some cubic material contained within the sample chamber. Recently, the author has extended this work to 77 K using helium gas for the applied force, rather than hydraulic oil