Microstructure of amorphous-silicon-based solar cell materials by small-angle x-ray scattering. Annual technical report, April 6, 1995--April 5, 1996 | Zendy

D. L. Williamson | Zendy

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Microstructure of amorphous-silicon-based solar cell materials by small-angle x-ray scattering. Annual technical report, April 6, 1995--April 5, 1996

Author(s) -

D. L. Williamson

Publication year - 1996

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/285505

Subject(s) - microstructure , materials science , amorphous solid , amorphous silicon , silicon , solar cell , scattering , phase (matter) , optics , engineering physics , optoelectronics , composite material , crystalline silicon , crystallography , physics , chemistry , quantum mechanics

The objective of this project is to provide detailed microstructural information on the amorphous silicon based thin film materials under development for improved multijunction solar cells. Correlation of microstructure with opto-electrical properties and device performance is an integral part of the research. During this second phase of our three-year program we have obtained information on the microstructure of materials relevant to the Low-, Mid-, and High-bandgap Teams and the results are appropriately divided into these three types of material as presented below. The experimental methods, data analysis, and interpretation procedures are the same as those described in detail in the phase-one report and in the review paper published last year

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