Open AccessThe application of a microstrip gas counter to energy-dispersive x-ray fluorescence analysis
Author(s) -
J.F.C.A. Veloso,
J. M. F. dos Santos,
C.A.N. Conde,
R.E. Morgado
Publication year - 1996
Language(s) - English
Resource type - Reports
DOI - 10.2172/266749
Subject(s) - proportional counter , linearity , spectrometer , analytical chemistry (journal) , anode , cathode , materials science , detector , xenon , resolution (logic) , range (aeronautics) , microstrip , hollow cathode lamp , energy (signal processing) , spectral line , biasing , x ray fluorescence , voltage , optics , atomic physics , fluorescence , physics , chemistry , electrode , quantum mechanics , chromatography , artificial intelligence , astronomy , computer science , atomic absorption spectroscopy , composite material
Performance characteristics of a microstrip gas counter operated as a x-ray fluorescence spectrometer are reported. Gas amplification as a function of microstrip anode-cathode voltage was measured, and the breakdown threshold voltage was determined in pure xenon. The detector temporal stability and the effect of gas purity were assessed. Energy resolution and linearity, detection efficiency, and uniformity of spatial response in the 2- to 60-keV x-ray energy range were determined from the pulse-height distributions of the fluorescence x-ray spectra induced in a variety of single- and multi-element sample materials. Energy resolution similar to conventional proportional counters was achieved at 6 keV