Open AccessMeasurements of laser imprint by XUV radiography using an x-ray laser
Author(s) -
D. H. Kalantar,
L. DaSilva,
S. Glendinning
Publication year - 1996
Language(s) - English
Resource type - Reports
DOI - 10.2172/249256
Subject(s) - laser , optics , extreme ultraviolet , foil method , speckle pattern , irradiation , x ray laser , germanium , physics , materials science , beam (structure) , inertial confinement fusion , optoelectronics , silicon , laser power scaling , nuclear physics , composite material
We have developed a technique for studying the imprint of a laser beam on a thin foil using an x-ray laser as an XUV backlighter and XUV multilayer optics. This technique allows us to measure small fractional variations in the foil thickness due to hydrodynamics imprinted by direct laser irradiation. We present results of imprinted modulation and growth due to a low intensity 0.53 {mu}m drive beam incident on a 2 {mu}m Al foil using a germanium x-ray laser at the Vulcan facility. We present measurements of the modulation due to static RPP, SSD smoothed, and ISI smoothed speckle patterns at 0.53 {mu}m irradiation