Critical tests of line broadening theories by precision measurements
Author(s) -
S. Glenzer
Publication year - 1996
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/226048
Subject(s) - atomic physics , line (geometry) , doppler broadening , ion , opacity , spectral line , physics , plasma , electron , ionization , semiclassical physics , plasma diagnostics , spectral line shape , computational physics , quantum , optics , nuclear physics , quantum mechanics , geometry , mathematics
The spectral line profiles of ionized emitters in plasmas play an important role in the calculation of opacity, for short-wavelength laser studies, and for the diagnostics of inertial confinement fusion plasmas. Sophisticated theoretical methods and modeling have been advanced and applied in recent years to calculate spectral line profiles in the limits where broadening by electron collisions or by ion microfield dominates. Here, the authors describe recent measurements of spectral line profiles of a z-pinch experiment employing precision plasma diagnostic techniques. In particular, the electron-collisional-broadened 2s--2p transitions in B{sub III} have been investigated because their line profiles provide an excellent test for electron-impact line shape theories and electron collision strength calculations. Although they find good agreement with semiclassical calculations, a factor of two discrepancy with the most elaborate quantum-mechanical five-state close coupling calculations is observed. They discuss the experimental error estimates of the various measured quantities and show that the observed discrepancy can not be explained by experimental shortcomings. They further discuss measurements of non-isolated spectral lines of some {Delta}n = 1 transitions in C{sub IV}--O{sub VI}. For these transitions ion broadening dominates. Excellent agreement for the whole line profile with line broadening calculations is obtained for all cases only when including ion dynamic effects. The latter are calculated using the frequency-fluctuation model and account for about 10--25% of the line width of the considered ions
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