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RHEED studies of Ag/Si(111) growth at low temperatures
Author(s) -
U. Koehler
Publication year - 1996
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/215802
Subject(s) - nucleation , flux (metallurgy) , deposition (geology) , reflection high energy electron diffraction , growth rate , chemical physics , materials science , chemistry , thermodynamics , mineralogy , crystallography , nanotechnology , physics , geology , mathematics , metallurgy , geometry , epitaxy , geomorphology , layer (electronics) , sediment

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