Open AccessDevelopment of a high-resolution soft x-ray (30--1500 eV) beamline at the Advanced Light Source and its use for the study of angle-resolved photoemission extended fine structure
Author(s) -
W.R.A. Huff
Publication year - 1996
Language(s) - English
Resource type - Reports
DOI - 10.2172/211573
Subject(s) - scattering , physics , optics , beamline , atomic physics , photon , polarization (electrochemistry) , beam (structure) , materials science , chemistry