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Site-specific, synchrotron radiation induced surface photochemistry
Author(s) -
R. A. Rosenberg,
J. K. Simons,
S. P. Frigo
Publication year - 1995
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/195701
Subject(s) - synchrotron radiation , substrate (aquarium) , chemistry , spectral line , radiation , synchrotron , photochemistry , atomic physics , materials science , physics , optics , oceanography , astronomy , geology
This paper discusses recent research directed at understanding the nature of surface photochemistry driven by soft x-ray synchrotron radiation (SR). The research is motivated by the potential of x-rays for both high spatial resolution and site specificity. Although a number of systems indicate the potential for site specificity, the authors chose to study the system of SiF{sub 4}/Ge because the adsorbate`s photoabsorption spectrum is rich in structure near the Si 2p threshold (106 eV) while that of the substrate is structureless. This allows them to differentiate substrate-induced effects from those of the adsorbate. By performing time-dependent measurements of the changes induced in the photoemission spectra by SR, they have found that this system`s photochemistry is site-specific in the Si 2p region and have also determined the nature of the products produced by the reaction

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