Open AccessFlash X-Ray (FXR) Accelerator Optimization - Beam-induced Voltage Simulation and TDR Measurements
Author(s) -
M Ong,
G.E. Vogtlin
Publication year - 2004
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/15014170
Subject(s) - beam (structure) , voltage , physics , optics , cathode ray , flash (photography) , electron , nuclear physics , quantum mechanics
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