SRF Cavity Testing Using a FPGA Self Excited Loop
Author(s) -
I. BenZvi
Publication year - 2017
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1458517
Subject(s) - field programmable gate array , radio frequency , calibration , port (circuit theory) , rf power amplifier , electronic engineering , excited state , computer science , power (physics) , physics , electrical engineering , electronics , field (mathematics) , optics , engineering , computer hardware , mathematics , amplifier , cmos , quantum mechanics , pure mathematics , nuclear physics
This document provides a detailed description of procedures for very-high precision calibration and testing of superconducting RF cavities using digital Low-Level RF (LLRF) electronics based on Field Programmable Gate Arrays (FPGA). The use of a Self-Excited Loop with an innovative procedure for fast turn-on allows the measurement of the forward, reflected and transmitted power from a single port of the directional coupler in front of the cavity, thus eliminating certain measurement errors. Various procedures for measuring the quality factor as a function of cavity fields are described, including a single RF pulse technique. Errors are estimated for the measurements.
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