Open AccessBeta Backscatter Measurement of Aluminum Coatings on Mylar Substrates
Author(s) -
W.B. Abel,
R.V. Heckman
Publication year - 1974
Language(s) - English
Resource type - Reports
DOI - 10.2172/12483087
Subject(s) - anodizing , materials science , coating , aluminium , composite material , dielectric , deposition (geology) , substrate (aquarium) , alloy , current density , dielectric strength , electrolysis , amorphous solid , curing (chemistry) , metallurgy , analytical chemistry (journal) , optoelectronics , crystallography , chemistry , electrode , electrolyte , paleontology , oceanography , physics , quantum mechanics , sediment , biology , geology , chromatography