Analysis of Defect Structure in Silicon. Silicon Sheet Growth Development for the Large Area Silicon Sheet Task of the Low-Cost Solar Array Project
Author(s) -
R. Natesh,
Manolo G. Mena,
M.R. Plichta,
John R. Smith,
M Sellani
Publication year - 1982
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/12206368
Subject(s) - van der pauw method , silicon , grain boundary , materials science , boundary (topology) , nanocrystalline silicon , area density , optoelectronics , composite material , crystalline silicon , electrical engineering , engineering , hall effect , microstructure , mathematics , amorphous silicon , mathematical analysis , electrical resistivity and conductivity
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