ULTRASONIC FLAW DETECTION AND CHARACTERIZATION IN STRUCTURAL MATERIALS BY SPECTRAL ANALYSIS
Author(s) -
L. Adler,
K.V. Cook,
W. A. Simpson,
D. Kent Lewis,
D.W. Fitting
Publication year - 1978
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/12198682
Subject(s) - characterization (materials science) , spectral analysis , anisotropy , ultrasonic sensor , field (mathematics) , materials science , acoustics , optics , physics , nanotechnology , mathematics , spectroscopy , quantum mechanics , pure mathematics
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