Open AccessProgramming Enhancements for Low Temperature Thermal Decomposition Workstation
Author(s) -
R.E. Igou
Publication year - 1998
Language(s) - English
Resource type - Reports
DOI - 10.2172/12120
Subject(s) - obsolescence , reliability (semiconductor) , consistency (knowledge bases) , workstation , computer science , decomposition , reliability engineering , process (computing) , division (mathematics) , process engineering , systems engineering , engineering , operating system , mathematics , paleontology , ecology , power (physics) , physics , arithmetic , quantum mechanics , artificial intelligence , biology
This report describes a new control-and-measurement system design for the Oak Ridge Y-12 Plant's Low Temperature Thermal Decomposition (LTTD) process. The new design addresses problems with system reliability stemming from equipment obsolescence and addresses specific functional improvements that plant production personnel have identified, as required. The new design will also support new measurement techniques, which the Y-12 Development Division has identified for future operations. The new techniques will function in concert with the original technique so that process data consistency is maintained