REF1-horizontal-surface reflectometer-reference instrument WBS 1.7.10.
Author(s) -
R.K. Crawford
Publication year - 1999
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/12079
Subject(s) - schematic , table (database) , surface (topology) , range (aeronautics) , optics , materials science , computer science , physics , engineering , geometry , electrical engineering , composite material , database , mathematics
REF1 is designed to-study the reflectivity of horizontal surfaces, such as a free liquid surface. Figure 1 provides a schematic representation of REF1, and Table 1 gives the parameters for this instrument. The instrument will be useful for a wide range of science, including interfacial studies in polymers and surface chemistry involving thin layers of surfactants or other materials on the surfaces of liquids. The instrument geometry will be flexible so that other capabilities (e.g., polarized neutrons) can be added at a later date. Data rates will be sufficiently high to permit kinetic studies on many systems
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