Open AccessDescriptions of positron defect analysis capabilities
Author(s) -
R. H. Howell
Publication year - 1994
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/113995
Subject(s) - positron , positron annihilation , graphics , positron lifetime spectroscopy , semiconductor , annihilation , computer science , series (stratigraphy) , physics , nuclear physics , computer graphics (images) , optoelectronics , geology , paleontology , electron
A series of descriptive papers and graphics appropriate for distribution to potential collaborators has been assembled. These describe the capabilities for defect analysis using positron annihilation spectroscopy. The application of positrons to problems in the polymer and semiconductor industries is addressed
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