Open AccessFinal report on reliability and lifetime prediction.
Author(s) -
K.T. Gillen,
Jonathan Wise,
Gary D. Jones,
Al Causa,
Edward Terrill,
Marc Borowczak
Publication year - 2012
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1088087
Subject(s) - reliability (semiconductor) , profiling (computer programming) , reliability engineering , computer science , degradation (telecommunications) , data mining , engineering , telecommunications , power (physics) , physics , quantum mechanics , operating system
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