Open AccessLayout And Results From The Initial Operation Of The High-resolution X-ray Imaging Crystal Spectrometer On The Large Helical Device
Author(s) -
N. Pablant,
L Delgado-Apricio,
M. Goto,
Ken Hill,
S Lzerson,
S. Morita,
A. L. Roquemore,
D. Gates,
D. Monticello,
H Neilson,
A. Reiman,
M.L. Reinke,
J E Rice
Publication year - 2012
Language(s) - English
Resource type - Reports
DOI - 10.2172/1063122
Subject(s) - large helical device , thomson scattering , spectrometer , electron temperature , ion , electron density , plasma , electron , spectroscopy , plasma diagnostics , bent molecular geometry , crystal (programming language) , image resolution , resolution (logic) , calibration , materials science , scattering , atomic physics , physics , optics , nuclear physics , artificial intelligence , computer science , composite material , programming language , quantum mechanics
First results of ion and electron temperature pro le measurements from the x-ray imaging crystal spectrometer (XICS) diagnostic on the Large Helical Device (LHD) are presented. This diagnostic system has been operational since the beginning of the 2011 LHD experimental campaign and is the rst application of the XICS diagnostic technique to helical plasma geometry. The XICS diagnostic provides measurements of ion and electron temperature pro les in LHD with a spatial resolution of 2cm and a time resolution of ≥#21; 10ms. Ion temperature pro les from the XICS diagnostic are possible under conditions where charge exchange recombination spectroscopy (CXRS) is not possible (high density) or is perturbative to the plasma (low density or radio frequency heated plasmas). Measurements are made by using a spherically bent crystal to provide a spectrally resolved 1D image of the plasma from line integrated emission of helium-like Ar16+. The nal hardware design and con guration are detailed along with the calibration procedures. Line-integrated ion and electron temperature measurements are presented, and the measurement accuracy is discussed. Finally central temperature measurements from the XICS system are compared to measurements from the Thomson scattering and CXRS systems, showing excellent agreement