Open AccessSolid Phase Characterization of Tank 241-AY-102 Annulus Space Particulate
Author(s) -
Gary A. Cooke
Publication year - 2013
Language(s) - English
Resource type - Reports
DOI - 10.2172/1060951
Subject(s) - scanning electron microscope , diffractometer , materials science , characterization (materials science) , analytical chemistry (journal) , diffraction , electron microscope , phase (matter) , optics , chemistry , nanotechnology , physics , chromatography , composite material , organic chemistry
The Special Analytical Studies Group at the 222-S Laboratory (222-S) examined the particulate recovered from a series of samples from the annular space of tank 241-AY-102 (AY-102) using solid phase characterization (SPC) methods. These include scanning electron microscopy (SEM) using the ASPEX1 scanning electron microscope, X-ray diffraction (XRD) using the Rigaku2 MiniFlex X-ray diffractometer, and polarized light microscopy (PLM) using the Nikon3 Eclipse Pol optical microscope. The SEM is equipped with an energy dispersive X-ray spectrometer (EDS) to provide chemical information