Open AccessEarly time-series classification with reliability guarantee.
Author(s) -
Maya R. Gupta,
Nathan Parrish,
Hyrum S. Anderson
Publication year - 2012
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1051704
Subject(s) - computer science , reliability (semiconductor) , time series , series (stratigraphy) , data mining , segmentation , domain (mathematical analysis) , field (mathematics) , scale (ratio) , lagging , anomaly detection , time domain , machine learning , artificial intelligence , geography , paleontology , power (physics) , physics , quantum mechanics , medicine , mathematical analysis , mathematics , cartography , pathology , pure mathematics , computer vision , biology
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