Finite-element analysis of the deformation of thin Mylar films due to measurement forces. | Zendy

Michael Baker | Zendy; Alex Robinson | Zendy; Hy D. Tran | Zendy

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Finite-element analysis of the deformation of thin Mylar films due to measurement forces.

Author(s) -

Michael Baker,

Alex Robinson,

Hy D. Tran

Publication year - 2012

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/1034880

Subject(s) - deformation (meteorology) , materials science , finite element method , gauge (firearms) , contact mechanics , ideal (ethics) , thin film , contact force , bearing (navigation) , mechanics , composite material , structural engineering , computer science , engineering , physics , classical mechanics , nanotechnology , metallurgy , philosophy , epistemology , artificial intelligence

Significant deformation of thin films occurs when measuring thickness by mechanical means. This source of measurement error can lead to underestimating film thickness if proper corrections are not made. Analytical solutions exist for Hertzian contact deformation, but these solutions assume relatively large geometries. If the film being measured is thin, the analytical Hertzian assumptions are not appropriate. ANSYS is used to model the contact deformation of a 48 gauge Mylar film under bearing load, supported by a stiffer material. Simulation results are presented and compared to other correction estimates. Ideal, semi-infinite, and constrained properties of the film and the measurement tools are considered

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