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Developments in crystallographic phase analysis in the SEM: Backscattered electron Kikuchi patterns
Author(s) -
J.R. Michael,
Raymond P. Goehner,
C. R. Hills
Publication year - 1993
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/10192028
Subject(s) - characterization (materials science) , phase (matter) , materials science , crystallography , scanning electron microscope , nanotechnology , chemistry , composite material , organic chemistry

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