Open AccessCalibration of the apparent temperature of silicon single crystals as a function of their true temperature and their thickness as determined by infrared measurements
Author(s) -
R. K. Smither,
P.B. Fernandez
Publication year - 1993
Language(s) - English
Resource type - Reports
DOI - 10.2172/10188457
Subject(s) - infrared , crystal (programming language) , silicon , materials science , optics , monocrystalline silicon , single crystal , optoelectronics , chemistry , crystallography , physics , computer science , programming language
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