Open AccessMicroscopic Origins of Metastable Effects in a-Si:H and Deep Defect Characterization in a-Si,Ge:H Alloys, Annual Subcontract Report, 1 February 1992 - 31 January 1993
Author(s) -
J. David Cohen
Publication year - 1993
Language(s) - English
Resource type - Reports
DOI - 10.2172/10180625
Subject(s) - photocurrent , band gap , materials science , deep level transient spectroscopy , metastability , diffusion capacitance , capacitance , alloy , spectral line , electron microprobe , analytical chemistry (journal) , trapping , silicon , molecular physics , optoelectronics , chemistry , physics , electrode , metallurgy , organic chemistry , chromatography , astronomy , ecology , biology