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In-Situ Characterization of Growth and Interfaces in a-Si:H Devices: Final Subcontract Report, 1 May 1991 - 31 May 1994
Author(s) -
R. W. Collins,
C. R. Wroński,
Ilsin An,
YiHsien Lu,
Hong-Oanh Nguyen
Publication year - 1994
Language(s) - English
Resource type - Reports
DOI - 10.2172/10170471
Subject(s) - characterization (materials science) , metastability , in situ , materials science , band gap , solar cell , photovoltaic system , oxide , silicon , work (physics) , optoelectronics , nanotechnology , engineering physics , chemistry , physics , mechanical engineering , electrical engineering , engineering , metallurgy , organic chemistry

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