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In situ studies of amorphization of the Ge-Al and Si-Al systems induced by 1 MeV electron irradiation
Author(s) -
Xi–Wei Lin,
David N. Seidman,
P.R. Okamoto
Publication year - 1990
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/10154302
Subject(s) - bilayer , irradiation , crystallography , materials science , amorphous solid , analytical chemistry (journal) , fluence , atomic physics , chemistry , physics , nuclear physics , biochemistry , chromatography , membrane

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