Open AccessSingle-electron charging effects. Technical progress report
Author(s) -
S. T. Ruggiero
Publication year - 1991
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/10152706
Subject(s) - quantum tunnelling , electron , scanning tunneling microscope , key (lock) , scanning tunneling spectroscopy , engineering physics , physics , nanotechnology , materials science , condensed matter physics , computer science , nuclear physics , computer security
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