Defect studies in low-temperature-grown GaAs
Author(s) -
David Emory Bliss
Publication year - 1992
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/10140831
Subject(s) - annealing (glass) , gallium , vacancy defect , doping , materials science , chemistry , activation energy , condensed matter physics , analytical chemistry (journal) , crystallography , metallurgy , optoelectronics , chromatography , physics
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