A surface science investigation of silicon carbide: Oxidation, crystal growth and surface structural analysis
Author(s) -
James M. Powers
Publication year - 1991
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/10132735
Subject(s) - x ray photoelectron spectroscopy , materials science , auger electron spectroscopy , amorphous solid , chemical vapor deposition , scanning electron microscope , analytical chemistry (journal) , low energy electron diffraction , sublimation (psychology) , chemical engineering , electron diffraction , nanotechnology , chemistry , composite material , crystallography , diffraction , optics , psychology , physics , chromatography , nuclear physics , engineering , psychotherapist
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