Open Access[Synchrotron studies of x-ray reflectivity from surfaces]. Technical progress report
Author(s) -
Peter S. Pershan
Publication year - 1992
Language(s) - English
Resource type - Reports
DOI - 10.2172/10130300
Subject(s) - scattering , auger , salient , optics , period (music) , x ray photoelectron spectroscopy , ellipsometry , x ray optics , physics , materials science , x ray , computer science , nanotechnology , atomic physics , thin film , artificial intelligence , nuclear magnetic resonance , acoustics