Apparent temperature versus true temperature of silicon crystals as a function of their thickness using infrared measurements | Zendy

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Apparent temperature versus true temperature of silicon crystals as a function of their thickness using infrared measurements

Author(s) -

R. K. Smither,

P. B. Fernandez

Publication year - 1993

Language(s) - English

Resource type - Reports

DOI - 10.2172/10110324

Subject(s) - infrared , materials science , silicon , optics , beamline , synchrotron radiation , crystal (programming language) , beam (structure) , optoelectronics , intensity (physics) , physics , computer science , programming language

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