Open AccessApparent temperature versus true temperature of silicon crystals as a function of their thickness using infrared measurements
Author(s) -
R.K. Smither,
P. Fernández
Publication year - 1993
Language(s) - English
Resource type - Reports
DOI - 10.2172/10110324
Subject(s) - infrared , materials science , silicon , optics , beamline , synchrotron radiation , crystal (programming language) , beam (structure) , optoelectronics , intensity (physics) , physics , computer science , programming language