Open AccessThin-film characterization and flaw detection. Progress report No. 7, February 1, 1993--January 31, 1994
Author(s) -
J. D. Achenbach
Publication year - 1993
Language(s) - English
Resource type - Reports
DOI - 10.2172/10107040
Subject(s) - materials science , thin film , isotropy , scanning acoustic microscope , optics , surface acoustic wave , anisotropy , acoustic microscopy , transducer , substrate (aquarium) , composite material , acoustics , microscopy , physics , nanotechnology , oceanography , geology