Illegal connection detection in a viscoelastic pipeline using inverse transient analysis in the time domain
Author(s) -
Ehsan Ebrahimi,
Mahmood Shafai Bejestan,
Babak Aminnejad
Publication year - 2022
Publication title -
water science and technology water supply
Language(s) - English
Resource type - Journals
eISSN - 1607-0798
pISSN - 1606-9749
DOI - 10.2166/ws.2022.120
Subject(s) - transient (computer programming) , pipeline transport , time domain , pipeline (software) , solver , calibration , sensitivity (control systems) , signal (programming language) , inverse , viscoelasticity , transient response , environmental science , acoustics , computer science , materials science , engineering , electronic engineering , mechanical engineering , mathematics , environmental engineering , electrical engineering , physics , composite material , computer vision , programming language , operating system , statistics , geometry
Illegal connection (IC) in water supply systems and water network wastes water as well as energy and reduces water quality, which has negative technical and economic effects on water management. Transient-based defect detection is a powerful method applied in water pipelines. This paper investigates the efficiency of the transient-based inverse transient analysis (ITA) method in estimating the characteristics of ICs in the viscoelastic water supply system in the time domain. To better evaluate this method, an experimental transient model was developed using polyethylene pipelines (with a length of 158 meters and a nominal diameter of 2 inches). In the first step, the hydraulic transient solver was calibrated in the calibration approach of dynamic parameters of pressure wave speed and pipe wall viscoelasticity. Then, the sensitivity of the ITA method to the spatial step of the method of characteristics and signal sample size was assessed. Finally, the efficiency of the ITA method was evaluated for several experiments with different transient intensities and a noisy signal. The results indicated that the accuracy for locating the IC was higher than the accuracy for the IC's length.
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