Open AccessMeasurement of Complex Index of Refraction of Tungsten by Ellipsometry
Author(s) -
Ayumu Sato,
Takahito Kashiwagi,
Seishi Sekine,
Masashi Ohkawa
Publication year - 2000
Publication title -
journal of the illuminating engineering institute of japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.101
H-Index - 4
eISSN - 1349-838X
pISSN - 0019-2341
DOI - 10.2150/jieij1980.84.appendix_39
Subject(s) - ellipsometry , index (typography) , refraction , refractive index , tungsten , optics , geology , materials science , physics , computer science , nanotechnology , metallurgy , thin film , world wide web
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