Open AccessMeasurement of Complex Index of Refraction of Tungsten by Ellipsometry
Author(s) -
Ayumu Sato,
Takahito Kashiwagi,
Satoshi Sekine,
Masashi Ohkawa
Publication year - 2000
Publication title -
shoumei gakkai zasshi/shoumei gakkaishi/shōmei gakkai zasshi
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.101
H-Index - 4
eISSN - 1349-838X
pISSN - 0019-2341
DOI - 10.2150/jieij1980.84.appendix_39
Subject(s) - ellipsometry , index (typography) , refraction , refractive index , tungsten , optics , geology , materials science , physics , computer science , nanotechnology , metallurgy , thin film , world wide web