Scanning conductance microscopy investigations on fixed human chromosomes | Zendy

Casper Hyttel Clausen | Zendy; Jacob Moresco Lange | Zendy; Linda Jensen | Zendy; Pranjul Shah | Zendy; Maria Dimaki | Zendy; Winnie Edith Svendsen | Zendy

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Scanning conductance microscopy investigations on fixed human chromosomes

Author(s) -

Casper Hyttel Clausen,

Jacob Moresco Lange,

Linda Jensen,

Pranjul Shah,

Maria Dimaki,

Winnie Edith Svendsen

Publication year - 2008

Publication title -

biotechniques

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.617

H-Index - 131

eISSN - 1940-9818

pISSN - 0736-6205

DOI - 10.2144/000112676

Subject(s) - dielectric , microscopy , conductance , cantilever , materials science , scanning ion conductance microscopy , microfluidics , atomic force microscopy , scanning probe microscopy , analytical chemistry (journal) , nanotechnology , biophysics , optics , chemistry , optoelectronics , scanning confocal electron microscopy , physics , composite material , biology , condensed matter physics , chromatography

Scanning conductance microscopy investigations were carried out in air on human chromosomes fixed on pre-fabricated SiO2 surfaces with a backgate. The point of the investigation was to estimate the dielectric constant of fixed human chromosomes in order to use it for microfluidic device optimization. The phase shift caused by the electrostatic forces, together with geometrical measurements of the atomic force microscopy (AFM) cantilever and the chromosomes were used to estimate a value for the dielectric constant of different human chromosomes.

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