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Persistence of Innovation in Dutch Manufacturing: Is it Spurious?
Author(s) -
Wladimir Raymond,
Pierre Mohnen,
Franz C. Palm,
Sybrand Schim van der Loeff
Publication year - 2006
Publication title -
ssrn electronic journal
Language(s) - English
Resource type - Journals
ISSN - 1556-5068
DOI - 10.2139/ssrn.894203
Subject(s) - tobit model , persistence (discontinuity) , spurious relationship , panel data , econometrics , economics , industrial organization , product (mathematics) , product innovation , business , engineering , mathematics , statistics , geotechnical engineering , geometry

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