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Low Temperature Photoluminescence (PL) from High Electron Mobility Transistors (HEMTs)
Author(s) -
Adam Roberts,
Henry O. Everitt
Publication year - 2015
Language(s) - English
Resource type - Reports
DOI - 10.21236/ada614121
Subject(s) - photoluminescence , optoelectronics , transistor , materials science , high electron mobility transistor , electron , induced high electron mobility transistor , electrical engineering , physics , engineering , voltage , nuclear physics
: The purpose of this report is to investigate the low temperature Photoluminescence (PL) from High Electron Mobility Transistor (HEMT) structures that have been modified by proton irradiation. The samples are aluminum gallium nitride (AlGaN)/gallium nitride (GaN) and indium aluminum nitride (InAlN)/GaN HEMT structures. These samples were cooled to 13 K and excited with Continuous Wave (CW) lasers at 325 and 244 nanometers to look for PL originating from a Two-Dimensional Electron Gas (2DEG).

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