Open AccessFabrication and Characterization of Photoconductive AlGaN Detectors/Structural Characterization of SiC Wafers
Author(s) -
Marek Skowroński
Publication year - 2001
Language(s) - English
Resource type - Reports
DOI - 10.21236/ada387507
Subject(s) - characterization (materials science) , wafer , fabrication , materials science , photoconductivity , optoelectronics , detector , nanotechnology , optics , physics , medicine , alternative medicine , pathology
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