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Program to Study the Process Parameters of OMVPE and Their Relationship to the Properties of Ga(0.47)In(0.53)As ON InP Substrates
Author(s) -
Irfan Ahmed
Publication year - 1989
Language(s) - English
Resource type - Reports
DOI - 10.21236/ada226618
Subject(s) - process (computing) , materials science , process engineering , optoelectronics , nanotechnology , computer science , engineering , operating system

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