z-logo
open-access-imgOpen Access
Synchrotron X-Ray Rietveld Analysis of α-Hafnium Phosphate
Author(s) -
Izumi Nakai,
Katsuhiro Imai,
Takuji Kawashima,
K. Ohsumi,
Fujio Izumi,
Isao Tomita
Publication year - 1990
Publication title -
analytical sciences
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.392
H-Index - 73
eISSN - 1348-2246
pISSN - 0910-6340
DOI - 10.2116/analsci.6.689
Subject(s) - chemistry , isostructural , rietveld refinement , monoclinic crystal system , hafnium , synchrotron , x ray , synchrotron radiation , crystal structure , zirconium , crystallography , x ray crystallography , ion , analytical chemistry (journal) , inorganic chemistry , optics , diffraction , physics , organic chemistry , chromatography

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom