
Synchrotron X-Ray Rietveld Analysis of α-Hafnium Phosphate
Author(s) -
Izumi Nakai,
Katsuhiro Imai,
Takuji Kawashima,
Kazumasa Ohsumi,
Fujio Izumi,
Isao Tomita
Publication year - 1990
Publication title -
analytical sciences
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.392
H-Index - 73
eISSN - 1348-2246
pISSN - 0910-6340
DOI - 10.2116/analsci.6.689
Subject(s) - chemistry , isostructural , rietveld refinement , monoclinic crystal system , hafnium , synchrotron , x ray , synchrotron radiation , crystal structure , zirconium , crystallography , x ray crystallography , ion , analytical chemistry (journal) , inorganic chemistry , optics , diffraction , physics , organic chemistry , chromatography