Atomic-Resolution X-Ray Fluorescence Holography of Zn (0.02 wt%) in a GaAs Wafer
Author(s) -
Kouichi Hayashi,
Tokujiro Yamamoto,
Jun Kawai,
Motohiro Suzuki,
Shunji Goto,
Shinjiro Hayakawa,
Kenji Sakurai,
Yohichi Gohshi
Publication year - 1998
Publication title -
analytical sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.392
H-Index - 73
eISSN - 1348-2246
pISSN - 0910-6340
DOI - 10.2116/analsci.14.987
Subject(s) - chemistry , wafer , fluorescence , x ray fluorescence , resolution (logic) , holography , x ray , analytical chemistry (journal) , optoelectronics , optics , environmental chemistry , computer science , physics , artificial intelligence
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