Open AccessA Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle
Author(s) -
Songyan Zheng,
Yohichi Gohshi
Publication year - 1997
Publication title -
analytical sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.392
H-Index - 73
eISSN - 1348-2246
pISSN - 0910-6340
DOI - 10.2116/analsci.13.997
Subject(s) - xanes , chemistry , total internal reflection , incidence (geometry) , angle of incidence (optics) , yield (engineering) , reflection (computer programming) , electron , signal (programming language) , absorption (acoustics) , atomic physics , optics , analytical chemistry (journal) , spectral line , physics , nuclear physics , chromatography , astronomy , computer science , thermodynamics , programming language