Open AccessAngular Distribution Measurement of Atoms Evaporated from a Resistive Oven Applied to Ion Beam Production
Author(s) -
Alexandre Leduc,
T. Thuillier,
L. Maunoury,
O. Bajeat
Publication year - 2020
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.18429/jacow-ecris2020-tuxzo03
Subject(s) - resistive touchscreen , materials science , beam (structure) , atomic physics , ion , ion beam , optics , electrical engineering , chemistry , physics , engineering , organic chemistry